Test Hat for X-Bands Antennas
Technical specifications
X-Band data downlink testing. On the platform. No chamber.
100 × 100 mm footprint — matches all Anywaves X-Band antennas
The Test Hat for X-Band Antennas is designed to fit exactly the 100 × 100 mm panel footprint shared by the Compact X-Band Antenna, the Wide Beam X-Band Antenna, the Compact X-Band Dual-Polarized Antenna and the High Gain X-Band Antenna. Its 4 × M3 captive screws are provided with the test hat, screwing directly into the antenna’s unthreaded holes — no additional hardware required. An oriented slot ensures correct and repeatable positioning at every test session.
TVAC compatible — qualified to +85°C for high-temperature test campaigns
The Test Hat for X-Band Antennas is qualified for thermal vacuum environments from −40°C to +85°C, with low outgassing properties making it safe to use inside a TVAC chamber. Its upper temperature qualification limit of +85°C — higher than the GNSS and S-Band test hats — accommodates the more demanding thermal environments that X-Band payload downlink antennas may be tested in, particularly on high-power platforms. Low RF leakage protects operators from radiation during testing.
Compatible with LHCP and RHCP — one tool for the full X-Band family
The Test Hat is compatible with both Left Hand and Right Hand Circular Polarization, making it suitable for use with all Anywaves X-Band antenna variants: the standard Compact X-Band Antenna (LHCP or RHCP), the Wide Beam X-Band Antenna (LHCP or RHCP), the Compact X-Band Dual-Polarized Antenna, and the High Gain X-Band Antenna (LHCP or RHCP). A single test hat covers the entire Anywaves X-Band payload downlink antenna family, simplifying both procurement and inventory management across a programme.
X-Band payload downlink RF verification at every stage of integration
The Anywaves Test Hat for X-Band Antennas enables complete end-to-end RF testing of the X-Band payload downlink antenna and transmitter chain directly on the satellite platform, from assembly bench to final TVAC testing. Covering the 8–8.4 GHz X-Band data downlink range with a coupling factor of approximately −27 dB, it eliminates the need for anechoic chamber measurements during integration — saving time and cost while delivering reproducible RF measurements at every stage of the AIT campaign.
Its 100 × 100 mm square base matches the footprint of all Anywaves X-Band antennas. Captive M3 screws are provided, screwing directly into the antenna interface with no additional hardware. TVAC compatible to +85°C with low outgassing. Compatible with LHCP and RHCP, covering the full range of X-Band antenna configurations. Low RF leakage protects operators during the test. 615 g. ITAR Free.
Test your X-Band downlink chain. On your platform. At every stage.
Tell us about your integration campaign and testing requirements. Our engineers will help you get reliable, repeatable RF measurements from your X-Band payload downlink antenna without the anechoic chamber.
Questions & Answers
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Which X-Band antennas is this Test Hat compatible with?
The Test Hat for X-Band Antennas is compatible with all Anywaves X-Band payload downlink antennas that share the 100 × 100 mm panel footprint: the Compact X-Band Antenna (LHCP or RHCP), the Wide Beam X-Band Antenna (LHCP or RHCP) and the Compact X-Band Dual-Polarized Antenna.. The test hat’s 4 × M3 captive screws fit directly into the unthreaded holes of each antenna, and its compatible with both LHCP and RHCP polarization — so a single test hat covers the entire family. Note that a Test Hat compatible version of the antenna is required.
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Why does this Test Hat have a different form factor from the GNSS and S-Band test hats?
The Test Hat for X-Band Antennas is designed around the square 100 × 100 mm footprint of the Anywaves X-Band antenna family — which is itself square, unlike the circular aperture of the GNSS and S-Band TT&C antennas. The result is a compact 100.2 × 100.2 × 106.2 mm cube rather than the cylindrical form factor of the other test hats, and a lighter mass of 615 g compared to approximately 915–920 g for the GNSS and S-Band variants. The operating principle and benefits are identical: single-part, screwed directly on the antenna, TVAC compatible, low RF leakage.
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What is the significance of the +85°C upper qualification temperature?
The Test Hat for X-Band Antennas is qualified to +85°C — 15°C above the +70°C upper limit of the GNSS and S-Band test hats. This higher upper limit accommodates the potentially more demanding thermal environments encountered when testing X-Band transmitter chains, which can involve higher RF power levels (the X-Band test hat is rated for up to 20 W RF power input). It also gives more headroom for TVAC test profiles that push the antenna assembly towards the upper end of its operational temperature range.
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Can the Test Hat be used for testing the Compact X-Band Dual-Polarized Antenna?
Yes. The Compact X-Band Dual-Polarized Antenna shares the same 100 × 100 mm footprint and mechanical interface as the other X-Band antennas, and the Test Hat is compatible with it. When testing the dual-polarized antenna, the test hat couples into the combined LHCP + RHCP aperture simultaneously. The integration team should verify that their RF chain test setup correctly accounts for the two-port nature of the dual-polarized antenna (with both LHCP and RHCP SMA connectors) when interpreting the coupled signal levels.
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What is the difference between this Test Hat and the Test Hat for S-Band TT&C Antennas?
The two products share the same operating concept — single-part GSE, screwed directly onto the antenna, TVAC compatible, low RF leakage — but are optimised for different frequency ranges, antenna footprints and form factors. The X-Band Test Hat covers 7.9–8.5 GHz with a 100 × 100 mm square base, weighs 615 g and is qualified to +85°C. The S-Band Test Hat covers 1.98–2.29 GHz with a Ø 117 mm cylindrical base, weighs 910 g and is qualified to +70°C. The two products are not interchangeable and are each designed for their specific antenna aperture.
Test Hat for X-Band Antennas: on-platform payload downlink RF testing
The Anywaves Test Hat for X-Band Antennas is a ground support equipment (GSE) tool for performing end-to-end RF testing of Anywaves X-Band payload downlink antennas directly on the satellite platform. Covering 7.9 to 8.5 GHz, it provides a coupling factor of approximately −30 db, allowing reproducible RF chain measurements for X-Band data downlink verification without an anechoic chamber. Compatible with Left Hand and Right Hand Circular Polarization.
Its 100.2 × 100.2 mm square base matches the footprint of all Anywaves X-Band antennas (Compact X-Band, Wide Beam X-Band, Compact X-Band Dual-Polarized, High Gain X-Band). The 4 × M3 captive screws are provided with the test hat and screw directly into the antenna interface — no additional hardware required. Qualified for thermal vacuum environments (low outgassing, −40°C to +85°C). Low RF leakage protects operators during testing. Envelope: 100.2 × 100.2 × 106.2 mm, mass 615 g (±5%), SMA female connector (50Ω). ITAR Free.
